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Test Development Services
Test Development Services

JCET provides customers with test development and test program migration services.  Our capabilities include:

• Design for Manufacturing (DFM) consultation
• Test program development, debug and validation
• Device characterization
• First silicon characterization (wafer test)
• Test program optimization including test time optimization
• Probe card design, fabrication and qualification (wafer test)
• Load board design, fabrication and qualification (final test)
• Design, fabrication and qualification of any other interfacing hardware (final test)
• Multi-site migration to higher parallel testing
• Test program migration to a different test platform

Included with these services are any test program changes required to rapidly maximize and stabilize first pass yields for high volume production.

Test Development Flow



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联系我们 客户查询 法律声明

版权所有@江苏长电科技股份有限公司 保留一切权利 苏ICP备05082751号32028102000607

版权所有@江苏长电科技股份有限公司
保留一切权利
苏ICP备05082751号 32028102000607